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Homepage>IEEE Standards>29 ELECTRICAL ENGINEERING>29.080 Insulation>29.080.30 Insulation systems>IEEE 2465-2023 - IEEE Trial-Use Recommended Practice for Pulse-Type Partial Discharge Measurements on Individual Stator Coils and Bars
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Released: 22.03.2024

IEEE 2465-2023 - IEEE Trial-Use Recommended Practice for Pulse-Type Partial Discharge Measurements on Individual Stator Coils and Bars

IEEE Trial-Use Recommended Practice for Pulse-Type Partial Discharge Measurements on Individual Stator Coils and Bars

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Standard number:IEEE 2465-2023
Released:22.03.2024
ISBN:979-8-8557-0407-5
Pages:49
Status:Active
Language:English
DESCRIPTION

IEEE 2465-2023

This document describes pulse-type partial discharge (PD) test methods for individual form-wound stator coils and bars that are equipped with PD suppression coatings and energized using a sinusoidal voltage source. It includes a procedure for measurement in terms of apparent charge at frequencies below 1 MHz. It also includes a procedure for measurements in millivolts at higher frequencies up to 300 MHz. This document does not provide pass/fail criteria.

The purposes of this recommended practice are as follows: a) To provide a uniform procedure for pulse-type PD measurements on the groundwall insulation system of individual form-wound stator coils and bars in order to obtain consistent results. b) To describe the measurement circuits. c) To describe the simulated slot and external factors affecting the measurements. d) To recommend a method for calibration or normalization. e) To recommend appropriate test voltage levels. f) To determine the need and parameters for conditioning. g) To provide guidelines for the interpretation of test results.

New IEEE Standard - Active. Pulse-type partial discharge test methods for individual form-wound stator coils and bars that are equipped with PD suppression coatings and energized with a sinusoidal voltage source are described in this recommended practice. A uniform procedure for measurements in terms of apparent charge at frequencies below 1 MHz and for measurements in millivolts at higher frequencies, up to 300 MHz is also provided in this recommended practice. This document does not provide pass/fail criteria, but it does describe the measurement circuit, the simulated slot, external factors affecting the measurements, the recommended method for calibration or normalization, appropriate test voltage levels, the need for and parameters of conditioning, and it provides guidelines for interpretation of test results.