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Homepage>IEEE Standards>29 ELECTRICAL ENGINEERING>29.120 Electrical accessories>29.120.20 Connecting devices>IEEE 592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
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Released: 08.05.2008

IEEE 592-2007 - IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

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Standard number:IEEE 592-2007
Released:08.05.2008
ISBN:978-0-7381-5348-3
Pages:10
Status:Active
Language:English
DESCRIPTION

IEEE 592-2007

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.



Revision Standard - Superseded. Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
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