PRICES include / exclude VAT
Sponsored link
Released: 07.09.2023
IEEE C37.233-2023 - IEEE Guide for Power System Protection Testing
IEEE Guide for Power System Protection Testing
Format
Availability
Price and currency
English PDF
Immediate download
127.33 EUR
English Hardcopy
In stock
157.46 EUR
Standard number: | IEEE C37.233-2023 |
Released: | 07.09.2023 |
ISBN: | 978-1-5044-9850-0 |
Pages: | 135 |
Status: | Active |
Language: | English |
DESCRIPTION
IEEE C37.233-2023
This guide covers suggested test requirements for power system protection scheme testing, system application tests, the scope and level of tests based on the application, and benefits of the overall protective schemes testing. This guide encompasses overall system testing procedures (generators, line, line reactors, transformer, capacitors, special protection schemes, end-to-end testing, distributed application within substation, etc.) and data collection requirements, as well as the test procedure definitions. This guide describes the methods, extent, and types of system tests for protection applications at various voltage levels. Control functions inherent to the protective systems are included. Importance of line testing, indirect trip applications, open/closed-loop tests, and dynamic/nonlinear tests are also covered.This guide is intended for power system protection professionals. It includes a reference list of type tests for protective devices as well as overall protection scheme performance tests for various types of protection schemes. The guide describes the methods, extent, and types of protection scheme tests. Interlocking and control functions inherent to the protective schemes are included
Revision Standard - Active. Test approaches and procedures for the components and the overall protection and control system functions are presented in this guide. Test of equipment in the system protection scheme, associated communications equipment, auxiliary power supplies, and the control of power apparatus are addressed. Much of the testing emphasizes a bottom-up approach, in which the basic behavior of scheme components are verified first, followed by testing of interconnected components in a function-oriented assembly.