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Released: 15.10.2010
IEEE C57.12.90-2010 - IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and Regulating Transformers
IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and Regulating Transformers
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Standard number: | IEEE C57.12.90-2010 |
Released: | 15.10.2010 |
ISBN: | 978-0-7381-6381-9 |
Pages: | 100 |
Status: | Active |
Language: | English |
DESCRIPTION
IEEE C57.12.90-2010
This standard describes methods for performing tests specified in IEEE Std C57.12.00(TM) and other standards applicable to liquid-immersed distribution, power, and regulating transformers.1 It is intended for use as a basis for performance and proper testing of such transformers. This standard applies to all liquid-immersed transformers, except instrument transformers, step-voltage and induction voltage regulators, arc furnace transformers, rectifier transformers, specialty transformers, grounding transformers, and mine transformers. Transformer requirements and specific test criteria are not a part of this standard, but they are contained in appropriate standards, such as IEEE Std C57.12.00, ANSI C57.12.10 [B1],2 IEEE Std C57.12.20(TM), and IEEE Std C57.12.40(TM) [B10], or in user specifications.The purpose of this standard is to provide test procedure information for tests specified in IEEE Std C57.12.00 and other standards applicable to liquid-immersed distribution, power, and regulating transformers. It is intended for use as a basis for performance and proper testing of such transformers.
Revision Standard - Superseded. Methods for performing tests specified in IEEE Std C57.12.00(TM) and other standards applicable to liquid-immersed distribution, power, and regulating transformers are described. Instrument transformers, step-voltage and induction voltage regulators, arc furnace transformers, rectifier transformers, specialty transformers, grounding transformers, and mine transformers are excluded. This standard covers resistance measurements, polarity and phase-relation tests, ratio tests, no-load loss and excitation current measurements, impedance and load loss measurements, dielectric tests, temperature tests, short-circuit tests, audible sound level measurements, and calculated data.