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Homepage>IEEE Standards>35 INFORMATION TECHNOLOGY. OFFICE MACHINES>35.240 Applications of information technology>35.240.30 IT applications in information, documentation and publishing>IEEE/IEC 61671-5-2016 - IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
Released: 08.04.2016

IEEE/IEC 61671-5-2016 - IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description

IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description

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Standard number:IEEE/IEC 61671-5-2016
Released:08.04.2016
ISBN:978-1-5044-0866-0
Pages:32
Status:Active
Language:English
DESCRIPTION

IEEE/IEC 61671-5-2016

This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.



Adoption Standard - Active. An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.
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