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Homepage>IEEE Standards>35 INFORMATION TECHNOLOGY. OFFICE MACHINES>35.060 Languages used in information technology>IEEE/IEC 62527-2007 - IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
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Released: 09.12.2007

IEEE/IEC 62527-2007 - IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

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Standard number:IEEE/IEC 62527-2007
Released:09.12.2007
ISBN:9-7807-3815-7238
Pages:44
Status:Active
Language:English
DESCRIPTION

IEEE/IEC 62527-2007





New IEEE Standard - Active. This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
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