IEEE/IEC 62528-2007

IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.

The aim of IEEE Std 1500 is to provide a consistent scalable solution to the test reuse challenges specific to the reuse of nonmergeable cores, while preserving the IP aspects that are often associated with these cores. This objective is achieved through provision of a core-centric methodology that enables successful integration of cores into SoCs. IEEE Std 1500 provides a bridge between core providers and core users and also facilitates the automation of test data transfer and reuse between these two entities via the use of the IEEE P1450.6 CTL. This automation relies on information requirements (the information model) placed on the core provider to ensure that the core can be successfully integrated by the core user. The result is shorter time to market for core providers and core users. The data transfer and reuse from the core provider to the core user are based on the premise that the core test data are left unchanged, while the test protocol is adapted from the IEEE 1500 hardware interface to the SoC.

New IEEE Standard - Superseded. Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.