IEEE/IEC 62860-1-2013

This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

The purpose of this standard is to provide a method for systematically characterizing organic transistorbased ring oscillators. This standard is intended to maximize reproducibility of published results by providing a framework for testing organic ring oscillators, whose unique properties cause measurement issues not typically encountered with inorganic-based circuitry. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.

Adoption Standard - Active. Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.