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Homepage>IEEE Standards>35 INFORMATION TECHNOLOGY. OFFICE MACHINES>35.240 Applications of information technology>35.240.30 IT applications in information, documentation and publishing

35.240.30 IT applications in information, documentation and publishing

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22 results
First page12
IEEE 1671.1-2017/Cor 1-2023 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions - Corrigendum 1
Released: 26.04.2024
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0.00 EUR
IEEE/IEC 61671-2012 - IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Released: 16.07.2012
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367.80 EUR
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462.96 EUR
IEEE 1671.5-2015 - IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
Released: 08.05.2015
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68.43 EUR
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55.60 EUR
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71.64 EUR
IEEE 1671.6-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
Released: 01.02.2013
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80.19 EUR
IEEE 1671-2006 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Released: 15.12.2006
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111.20 EUR
IEEE 1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description
Released: 13.04.2018
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161.45 EUR
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202.08 EUR
IEEE 1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
Released: 28.03.2008
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97.30 EUR
IEEE 1871.1-2014 - IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
Released: 10.02.2015
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201.01 EUR
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249.12 EUR
IEEE 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions
Released: 19.03.2018
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201.20 EUR
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252.72 EUR
IEEE/IEC 61671-4-2016 - IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration
IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration
Released: 08.04.2016
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83.40 EUR
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106.92 EUR
22 results
First page12