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Homepage>ISO Standards>ISO 23833:2013-Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
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download between 0-24 hoursReleased: 2013
ISO 23833:2013-Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

ISO 23833:2013

ISO 23833:2013-Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

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Standard´s number:ISO 23833:2013
Pages:27
Edition:2
Released:2013
DESCRIPTION

ISO 23833:2013


ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
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