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Homepage>ISO Standards>ISO 24173:2024-Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
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download between 0-24 hoursReleased: 2024
ISO 24173:2024-Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

ISO 24173:2024

ISO 24173:2024-Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

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Standard´s number:ISO 24173:2024
Pages:40
Edition:2
Released:2024
Language:English
DESCRIPTION

ISO 24173:2024


This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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