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Homepage>ISO Standards>ISO 3497:2000-Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
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ISO 3497:2000-Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods

ISO 3497:2000

ISO 3497:2000-Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods

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Standard´s number:ISO 3497:2000
Pages:18
Edition:3
Released:2000
DESCRIPTION

ISO 3497:2000