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Homepage>ISO Standards>ISO/TS 10798:2011-Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
download between 0-24 hoursReleased: 2011
ISO/TS 10798:2011-Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

ISO/TS 10798:2011

ISO/TS 10798:2011-Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

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English PDF
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180.00 EUR
English Hardcopy
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French Hardcopy
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Standard´s number:ISO/TS 10798:2011
Pages:26
Edition:1
Released:2011
DESCRIPTION

ISO/TS 10798:2011


ISO/TS 10798:2011 establishes methods to characterize the morphology, and to identify the elemental composition of catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis. The methods described in ISO/TS 10798:2011 for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).
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