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ISO/TS 10867:2019
ISO/TS 10867:2019-Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
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115.00 EUR
English Hardcopy
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French PDF
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French Hardcopy
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Standard´s number: | ISO/TS 10867:2019 |
Pages: | 17 |
Edition: | 2 |
Released: | 2019 |
DESCRIPTION
ISO/TS 10867:2019
This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy. It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities. The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.