Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>ISO Standards>ISO/TS 22933:2022-Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
Sponsored link
download between 0-24 hoursReleased: 2022
ISO/TS 22933:2022-Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS

ISO/TS 22933:2022

ISO/TS 22933:2022-Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS

Format
Availability
Price and currency
English PDF
Immediate download
115.00 EUR
English Hardcopy
In stock
115.00 EUR
Standard´s number:ISO/TS 22933:2022
Pages:15
Edition:1
Released:2022
Language:English
DESCRIPTION

ISO/TS 22933:2022


This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes.
Print