PD CEN/TR 10354:2011
Chemical analysis of ferrous Materials. Analysis of ferro-silicon. Determination of Si and Al by X-ray fluorescence spectrometry
Standard number: | PD CEN/TR 10354:2011 |
Pages: | 24 |
Released: | 2012-03-31 |
ISBN: | 978 0 580 77884 1 |
Status: | Standard |
PD CEN/TR 10354:2011
This standard PD CEN/TR 10354:2011 Chemical analysis of ferrous Materials. Analysis of ferro-silicon. Determination of Si and Al by X-ray fluorescence spectrometry is classified in these ICS categories:
- 77.080.10 Irons
This Technical Report describes a X-ray fluorescence (XRF) spectrometric method for the determination of Si and Al contents in ferro-silicon materials.
The method is applicable to:
Si contents between 40 % and 90 %;
Al contents between 0,5 % and 6 %.
The correction of the spectrometric measurement from spectral interferences on the analytical lines used is essential. This Technical Report is valid for the analytical lines:
Si Kα 7.126 (for element contents between 45 % and 90 %);
Al Kα 8.339 (for element contents between 0,8 % and 6 %);
Fe Kα 1.937 (for element contents between 10 % and 58 %).
NOTE For matrix matching purposes, iron is included in the analytical program to be prepared.
Within the conditions here above, spectral interferences don’t need to be calculated.