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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>PD ES 59008-4-1:2001 Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
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immediate downloadReleased: 2001-03-15
PD ES 59008-4-1:2001 Data requirements for semiconductor die. Specific requirements and recommendations Test and quality

PD ES 59008-4-1:2001

Data requirements for semiconductor die. Specific requirements and recommendations Test and quality

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Standard number:PD ES 59008-4-1:2001
Pages:14
Released:2001-03-15
ISBN:0 580 36972 2
Status:Standard
DESCRIPTION

PD ES 59008-4-1:2001


This standard PD ES 59008-4-1:2001 Data requirements for semiconductor die. Specific requirements and recommendations is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This series of European Specifications specifies requirements for the exchange of data pertaining to bare semiconductor die, with or without connection structures, and minimally packaged semiconductor die.

This Specification also gives recommendations for general industry good practice in the use of bare die, with or without connection structures, and minimally packaged die.

ES 59008-4-1 specifies the requirements for the data needed to describe the test and quality parameters of the die.


Specifies requirements for the data needed to describe the test and quality parameters of semiconductor die and gives recommendations for general industry good practice.