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Homepage>BS Standards>33 TELECOMMUNICATIONS. AUDIO AND VIDEO ENGINEERING>33.100 Electromagnetic compatibility (EMC)>33.100.20 Immunity>PD IEC/TR 61000-4-38:2015 Electromagnetic compatibility (EMC) Testing and measurement techniques. Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems
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immediate downloadReleased: 2015-09-30
PD IEC/TR 61000-4-38:2015 Electromagnetic compatibility (EMC) Testing and measurement techniques. Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems

PD IEC/TR 61000-4-38:2015

Electromagnetic compatibility (EMC) Testing and measurement techniques. Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems

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Standard number:PD IEC/TR 61000-4-38:2015
Pages:30
Released:2015-09-30
ISBN:978 0 580 77605 2
Status:Standard
DESCRIPTION

PD IEC/TR 61000-4-38:2015


This standard PD IEC/TR 61000-4-38:2015 Electromagnetic compatibility (EMC) is classified in these ICS categories:
  • 33.100.20 Immunity

This part of IEC 61000 , which is a Technical Report, defines a test protocol for flicker test systems designed to perform compliance tests in accordance with IEC 61000‑3‑3 and IEC 61000‑3‑11 . It is intended to provide test system manufacturers and testing laboratories with systematic methods to determine if the flicker test system meets the IEC design specifications for a wide range of voltage fluctuations and fluctuation frequencies, as specified in IEC 61000‑4‑15:2010, Table 5, that have been observed in product testing.

This protocol is intended to be compatible with related standards, in particular with any requirements set forth by listing organizations or measurement standards of the IEC. Meeting the criteria defined herein should not be construed as a waiver of any other relevant performance or safety requirements.

The main purpose of this technical report is to provide guidance and methods for periodic calibration and verification of systems consisting of previously type tested equipment. For complete flicker test systems that exhibit deviations of less than 5 % from the specifications of this protocol, it can be assumed that individual components are performing properly and separate calibration of individual system components is therefore not necessary.