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PD IEC TR 62396-8:2020 Process management for avionics. Atmospheric radiation effects Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines

PD IEC TR 62396-8:2020

Process management for avionics. Atmospheric radiation effects Proton, electron, pion, muon, alpha-ray fluxes and single event effects in avionics electronic equipment. Awareness guidelines

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Standard number:PD IEC TR 62396-8:2020
Pages:62
Released:2020-05-12
ISBN:978 0 580 96566 1
Status:Standard
PD IEC TR 62396-8:2020 - Process Management for Avionics

PD IEC TR 62396-8:2020 - Process Management for Avionics

In the ever-evolving world of avionics, ensuring the reliability and safety of electronic equipment is paramount. The PD IEC TR 62396-8:2020 standard provides comprehensive guidelines for managing the effects of atmospheric radiation on avionics systems. This document is an essential resource for professionals in the aerospace industry, offering insights into the impact of various radiation types, including protons, electrons, pions, muons, and alpha rays, on avionics electronic equipment.

Key Features of the Standard

  • Standard Number: PD IEC TR 62396-8:2020
  • Pages: 62
  • Release Date: May 12, 2020
  • ISBN: 978 0 580 96566 1
  • Status: Standard

Understanding Atmospheric Radiation Effects

Atmospheric radiation poses a significant challenge to avionics systems, particularly at high altitudes where exposure to cosmic rays is more pronounced. The PD IEC TR 62396-8:2020 standard delves into the various types of radiation that can affect electronic components, providing a detailed analysis of their potential impacts. By understanding these effects, engineers and designers can develop more robust systems that are better equipped to withstand the harsh conditions encountered during flight.

Proton, Electron, Pion, Muon, and Alpha-Ray Fluxes

The standard offers a thorough examination of the different types of radiation fluxes that can impact avionics systems:

  • Protons: High-energy particles that can cause significant damage to electronic components, leading to potential system failures.
  • Electrons: While generally less damaging than protons, electrons can still pose a risk to sensitive equipment, particularly in high-density environments.
  • Pions: These subatomic particles can interact with atomic nuclei, potentially leading to disruptive effects in electronic systems.
  • Muons: As highly penetrating particles, muons can traverse significant distances through materials, posing a unique challenge to avionics systems.
  • Alpha Rays: Composed of helium nuclei, alpha rays can cause ionization and damage to electronic components, necessitating careful management and mitigation strategies.

Single Event Effects in Avionics Electronic Equipment

Single Event Effects (SEEs) are a critical concern for avionics systems, as they can lead to transient or permanent disruptions in electronic components. The PD IEC TR 62396-8:2020 standard provides valuable guidance on identifying and mitigating these effects, ensuring the continued reliability and safety of avionics systems.

Types of Single Event Effects

The standard categorizes SEEs into several types, each with its own potential impact on avionics systems:

  • Single Event Upset (SEU): A temporary change in the state of a digital circuit, which can lead to data corruption or system malfunctions.
  • Single Event Latch-up (SEL): A condition where a parasitic structure within a semiconductor device is triggered, potentially leading to device failure.
  • Single Event Burnout (SEB): A catastrophic failure mode where a power device is permanently damaged due to excessive current flow.
  • Single Event Gate Rupture (SEGR): A failure mechanism in which the gate oxide of a MOSFET is damaged, leading to device malfunction.

Awareness Guidelines for Avionics Professionals

The PD IEC TR 62396-8:2020 standard serves as a vital resource for avionics professionals, providing awareness guidelines to help them understand and manage the effects of atmospheric radiation on electronic equipment. By following these guidelines, engineers and designers can enhance the resilience of avionics systems, ensuring their continued performance and safety in challenging environments.

Implementing Effective Mitigation Strategies

To effectively manage the impact of atmospheric radiation on avionics systems, the standard recommends a range of mitigation strategies, including:

  • Design Optimization: Incorporating radiation-hardened components and materials to enhance system resilience.
  • Redundancy: Implementing redundant systems and components to ensure continued operation in the event of a failure.
  • Shielding: Utilizing protective shielding to reduce exposure to harmful radiation.
  • Testing and Validation: Conducting rigorous testing and validation to assess system performance under radiation exposure.

Conclusion

The PD IEC TR 62396-8:2020 standard is an indispensable tool for avionics professionals seeking to understand and manage the effects of atmospheric radiation on electronic equipment. By providing comprehensive guidelines and awareness strategies, this standard empowers engineers and designers to develop more robust and reliable avionics systems, ensuring their continued performance and safety in the demanding conditions of modern aviation.

DESCRIPTION

PD IEC TR 62396-8:2020


This standard PD IEC TR 62396-8:2020 Process management for avionics. Atmospheric radiation effects is classified in these ICS categories:
  • 03.100.50 Production. Production management
  • 49.060 Aerospace electric equipment and systems
  • 31.020 Electronic components in general

This part of IEC 62396 is intended to provide awareness and guidance with regard to the effects of small particles (that is, protons, electrons, pions and muon fluxes) and single event effects on avionics electronics used in aircraft operating at altitudes up to 60 000 feet (18 300 m). This is an emerging topic and lacks substantive supporting data. This document is intended to help aerospace or ground level electronic equipment manufacturers and designers by providing awareness guidance for this new emerging topic.

Details of the radiation environment are provided together with identification of potential problems caused as a result of the atmospheric radiation received. Appropriate methods are given for quantifying single event effect (SEE) rates in electronic components.

NOTE 1 The overall system safety methodology is usually expanded to accommodate the single event effects rates and to demonstrate the suitability of the electronics for application at the electronic component, electronic equipment and system level.

NOTE 2 For the purposes of this document the terms "electronic device" and "electronic component" are used interchangeably.

Although developed for the avionics industry, this document can be used by other industrial sectors at their discretion.