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immediate downloadReleased: 2020-04-22
PD IEC TS 62607-5-3:2020
Nanomanufacturing. Key control characteristics Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
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| Standard number: | PD IEC TS 62607-5-3:2020 |
| Pages: | 24 |
| Released: | 2020-04-22 |
| ISBN: | 978 0 580 99198 1 |
| Status: | Standard |
DESCRIPTION
PD IEC TS 62607-5-3:2020
This standard PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics is classified in these ICS categories:
- 07.120 Nanotechnologies
- 07.030 Physics. Chemistry
This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.