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immediate downloadReleased: 2020-04-27
PD IEC TS 62607-8-1:2020
Nanomanufacturing. Key control characteristics Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current
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| Standard number: | PD IEC TS 62607-8-1:2020 |
| Pages: | 32 |
| Released: | 2020-04-27 |
| ISBN: | 978 0 539 13558 9 |
| Status: | Standard |
DESCRIPTION
PD IEC TS 62607-8-1:2020
This standard PD IEC TS 62607-8-1:2020 Nanomanufacturing. Key control characteristics is classified in these ICS categories:
- 07.120 Nanotechnologies
- 07.030 Physics. Chemistry
There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. This part of IEC 62607 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nanoenabled metal-oxide interfacial devices.
This document includes:
outlines of the experimental procedures used to measure TSC,
methods of interpretation of results and discussion of data analysis, and
case studies.