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BS EN 60747-16-3:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Frequency converters
Semiconductor devices Microwave integrated circuits. Frequency converters
Released: 2018-02-23
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339.30 EUR
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33.93 EUR
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101.79 EUR
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339.30 EUR
BS EN 60747-16-4:2004+A2:2017
Semiconductor devices Microwave integrated circuits. Switches
Semiconductor devices Microwave integrated circuits. Switches
Released: 2018-03-16
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322.92 EUR
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32.29 EUR
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96.88 EUR
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322.92 EUR
BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators
Semiconductor devices Microwave integrated circuits. Oscillators
Released: 2020-09-24
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322.92 EUR
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32.29 EUR
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96.88 EUR
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322.92 EUR
BS EN 60747-2:2016
Semiconductor devices Discrete devices. Rectifier diodes
Semiconductor devices Discrete devices. Rectifier diodes
Released: 2018-02-06
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322.92 EUR
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96.88 EUR
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BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
Released: 2003-01-17
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285.48 EUR
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28.55 EUR
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85.64 EUR
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285.48 EUR
BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
Released: 2003-01-20
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322.92 EUR
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32.29 EUR
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96.88 EUR
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322.92 EUR
BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
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147.42 EUR
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14.74 EUR
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44.23 EUR
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147.42 EUR
BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
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175.50 EUR
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17.55 EUR
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52.65 EUR
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175.50 EUR
BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Released: 2004-06-24
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44.23 EUR
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147.42 EUR
BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Released: 2010-10-31
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147.42 EUR
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14.74 EUR
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44.23 EUR
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147.42 EUR
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Released: 2003-07-07
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147.42 EUR
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14.74 EUR
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44.23 EUR
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147.42 EUR
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285.48 EUR
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28.55 EUR
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85.64 EUR
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285.48 EUR