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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Released: 2008-06-30
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175.50 EUR
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17.55 EUR
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52.65 EUR
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175.50 EUR
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Released: 2017-11-24
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17.55 EUR
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52.65 EUR
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175.50 EUR
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
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243.36 EUR
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24.34 EUR
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73.01 EUR
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BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Released: 2014-10-31
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147.42 EUR
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14.74 EUR
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44.23 EUR
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147.42 EUR
BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 2016-11-30
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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Released: 2017-11-24
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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Released: 2011-09-30
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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Released: 2017-11-27
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BS EN 60751:2008
Industrial platinum resistance thermometers and platinum temperature sensors
Industrial platinum resistance thermometers and platinum temperature sensors
Released: 2009-10-31
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BS EN 60754-1:2014+A1:2020
Test on gases evolved during combustion of materials from cables Determination of the halogen acid gas content
Test on gases evolved during combustion of materials from cables Determination of the halogen acid gas content
Released: 2020-04-16
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