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BS EN 62044-1:2002
Cores made of soft magnetic materials. Measuring methods Generic specification
Cores made of soft magnetic materials. Measuring methods Generic specification
Released: 2002-10-28
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14.74 EUR
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44.23 EUR
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147.42 EUR
BS EN 62044-2:2005
Cores made of soft magnetic materials. Measuring methods Magnetic properties at low excitation level
Cores made of soft magnetic materials. Measuring methods Magnetic properties at low excitation level
Released: 2021-06-15
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28.55 EUR
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85.64 EUR
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285.48 EUR
BS EN 62047-10:2011
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
Released: 2011-09-30
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175.50 EUR
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17.55 EUR
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52.65 EUR
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175.50 EUR
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243.36 EUR
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24.34 EUR
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73.01 EUR
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243.36 EUR
BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
Released: 2011-11-30
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85.64 EUR
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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Released: 2012-05-31
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175.50 EUR
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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Released: 2012-05-31
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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
Released: 2015-07-31
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175.50 EUR
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BS EN 62047-17:2015
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
Released: 2015-07-31
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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
Released: 2013-10-31
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175.50 EUR
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BS EN 62047-19:2013
Semiconductor devices. Micro-electromechanical devices Electronic compasses
Semiconductor devices. Micro-electromechanical devices Electronic compasses
Released: 2013-10-31
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285.48 EUR
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85.64 EUR
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285.48 EUR