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BS EN IEC 60746-4:2019
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Expression of performance of electrochemical analyzers Dissolved oxygen in water measured by membrane-covered amperometric sensors
Released: 2019-03-12
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27.04 USD
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81.12 USD
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270.40 USD
BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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81.12 USD
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270.40 USD
BS EN IEC 60747-16-7:2022
Semiconductor devices Microwave integrated circuits. Attenuators
Semiconductor devices Microwave integrated circuits. Attenuators
Released: 2023-05-25
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358.80 USD
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35.88 USD
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107.64 USD
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BS EN IEC 60747-16-8:2022
Semiconductor devices Microwave integrated circuits. Limiters
Semiconductor devices Microwave integrated circuits. Limiters
Released: 2023-05-25
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BS EN IEC 60747-17:2020
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
Released: 2021-02-03
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377.00 USD
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37.70 USD
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113.10 USD
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377.00 USD
BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
Semiconductor devices Optoelectronic devices. Photocouplers
Released: 2020-09-17
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113.10 USD
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BS EN IEC 60749-10:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-09-15
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BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-08-16
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BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Released: 2018-04-18
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163.80 USD
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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Released: 2018-04-30
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BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
Released: 2020-10-01
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BS EN IEC 60749-17:2019 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Released: 2020-02-24
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