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Homepage>UNE standards>UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General
in stockReleased: 2004-05-28
UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General

UNE EN 60749-1:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 1: General

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 1: Generalidades.

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Standard number:UNE EN 60749-1:2004
Pages:24
Released:2004-05-28
Status:Standard
DESCRIPTION

This standard UNE EN 60749-1:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 1: General is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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