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in stockReleased: 2003-11-21
UNE EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 16: Detección del ruido de impacto de partículas (PIND).
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60.72 EUR
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Spanish Hardcopy
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| Standard number: | UNE EN 60749-16:2003 |
| Pages: | 20 |
| Released: | 2003-11-21 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND) is classified in these ICS categories:
- 31.080.01