Log inSign up
LANGUAGE en
Menu
STOREE-ReadingHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 EUR
PRICES include / exclude VAT
Homepage>UNE standards>UNE EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Sponsored link
in stockReleased: 2003-05-30
UNE EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

UNE EN 60749-2:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 2: Baja presión atmosférica.

Format
Availability
Price and currency
English PDF
Immediate download
51.48 EUR
English Hardcopy
In stock
51.48 EUR
Spanish PDF
Immediate download
42.90 EUR
Spanish Hardcopy
In stock
42.90 EUR
Standard number:UNE EN 60749-2:2003
Pages:19
Released:2003-05-30
Status:Standard
DESCRIPTION

This standard UNE EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure. is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
Print