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Homepage>UNE standards>UNE EN 60749-23:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
in stockReleased: 2005-03-16
UNE EN 60749-23:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

UNE EN 60749-23:2005

Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.

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Standard number:UNE EN 60749-23:2005
Pages:25
Released:2005-03-16
Status:Standard
DESCRIPTION

This standard UNE EN 60749-23:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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