PRICES include / exclude VAT
Sponsored link
in stockReleased: 2005-03-16
UNE EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.
Format
Availability
Price and currency
English PDF
Immediate download
64.68 EUR
English Hardcopy
In stock
64.68 EUR
Spanish PDF
Immediate download
53.90 EUR
Spanish Hardcopy
In stock
53.90 EUR
| Standard number: | UNE EN 60749-23:2005 |
| Pages: | 25 |
| Released: | 2005-03-16 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 60749-23:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life is classified in these ICS categories:
- 31.080.01