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Homepage>UNE standards>UNE EN 60749-27:2006/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
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in stockReleased: 2013-01-01
UNE EN 60749-27:2006/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)

UNE EN 60749-27:2006/A1:2012

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 27: Ensayo de la sensibilidad de la descarga electrostática. Modelo máquina (HBM) (Ratificada por AENOR en enero de 2013.)

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Standard number:UNE EN 60749-27:2006/A1:2012
Pages:11
Released:2013-01-01
Status:Amendment
DESCRIPTION

This standard UNE EN 60749-27:2006/A1:2012 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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