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in stockReleased: 2017-08-01
UNE EN 60749-28:2017
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 28: Ensayo de la sensibilidad a la descarga electrostática. Modelo de dispositivo cargado- Nivel de dispositivo. (Ratificada por la Asociación Española de Normalización en agosto de 2017.)
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| Standard number: | UNE EN 60749-28:2017 |
| Pages: | 52 |
| Released: | 2017-08-01 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 60749-28:2017 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.) is classified in these ICS categories:
- 31.080.01