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Homepage>UNE standards>UNE EN 60749-29:2011 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
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in stockReleased: 2011-11-01
UNE EN 60749-29:2011 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)

UNE EN 60749-29:2011

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 29: Ensayo de enclavamiento. (Ratificada por AENOR en noviembre de 2011.)

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Standard number:UNE EN 60749-29:2011
Pages:26
Released:2011-11-01
Status:Standard
DESCRIPTION

This standard UNE EN 60749-29:2011 Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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