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Homepage>UNE standards>UNE EN 60749-31:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)
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in stockReleased: 2004-03-18
UNE EN 60749-31:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)

UNE EN 60749-31:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 31: Inflamabilidad de dispositivos con encapsulado plástico (provocada internamente).

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Standard number:UNE EN 60749-31:2004
Pages:16
Released:2004-03-18
Status:Standard
DESCRIPTION

This standard UNE EN 60749-31:2004 Semiconductor devices - Mechanical and climatic test methods -- Part 31: Flammability of plastic-encapsulated devices (internally induced) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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