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in stockReleased: 2005-03-16
UNE EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
Dispositivos semiconductores. Ensayos mecánicos y climáticos. Parte 33: Resistencia a la humedad acelerada. Autoclave no polarizada
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| Standard number: | UNE EN 60749-33:2005 |
| Pages: | 17 |
| Released: | 2005-03-16 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 60749-33:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave is classified in these ICS categories:
- 31.080.01