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Homepage>UNE standards>UNE EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
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in stockReleased: 2011-07-20
UNE EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

UNE EN 60749-34:2011

Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 34: Ciclo de potencia.

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Standard number:UNE EN 60749-34:2011
Pages:6
Released:2011-07-20
Status:Standard
DESCRIPTION

This standard UNE EN 60749-34:2011 Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling is classified in these ICS categories:

  • 31.080.01