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Homepage>UNE standards>UNE EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)
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in stockReleased: 2008-09-01
UNE EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)

UNE EN 60749-38:2008

Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.)

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 38: Método de ensayo del error transitorio para dispositivos semiconductores con memoria. (Ratificada por AENOR en septiembre de 2008.)

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Standard number:UNE EN 60749-38:2008
Pages:16
Released:2008-09-01
Status:Standard
DESCRIPTION

This standard UNE EN 60749-38:2008 Semiconductor devices- Mechanical and climatic test methods- Part 38: Soft error test method for semiconductor devices with memory (Endorsed by AENOR in September of 2008.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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