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Homepage>UNE standards>UNE EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.)
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in stockReleased: 2014-11-01
UNE EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.)

UNE EN 60749-42:2014

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 42: Almacenamiento en temperatura y humedad (Ratificada por AENOR en noviembre de 2014.)

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Standard number:UNE EN 60749-42:2014
Pages:12
Released:2014-11-01
Status:Standard
DESCRIPTION

This standard UNE EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.) is classified in these ICS categories:

  • 31.080.01