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Homepage>UNE standards>UNE EN 61189-5-503:2017 Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.)
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in stockReleased: 2017-09-01
UNE EN 61189-5-503:2017 Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.)

UNE EN 61189-5-503:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.)

Métodos de ensayo para materiales eléctricos, tarjetas impresas y otras estructuras de interconexión y montajes. Parte 5-503: Métodos de ensayo generales para materiales y montajes. Ensayo para filamentos anódicos conductores (CAF) de placas de circuito. (Ratificada por la Asociación Española de Normalización en septiembre de 2017.)

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Standard number:UNE EN 61189-5-503:2017
Pages:33
Released:2017-09-01
Status:Standard
DESCRIPTION

This standard UNE EN 61189-5-503:2017 Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.) is classified in these ICS categories:

  • 31.180