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Homepage>UNE standards>UNE EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
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in stockReleased: 2008-09-01
UNE EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)

UNE EN 61967-6:2002/A1:2008

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)

Circuitos integrados. Mediciones de las emisiones electromagnéticas de 150 kHz a 1 GHz. Parte 6: Mediciones de emisiones conducidas. Método de sonda magnética. (Ratificada por AENOR en septiembre de 2008.)

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Standard number:UNE EN 61967-6:2002/A1:2008
Pages:23
Released:2008-09-01
Status:Amendment
DESCRIPTION

This standard UNE EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.) is classified in these ICS categories:

  • 31.200
Categories:
UNE standards
31.200 Integrated circuits. Microelectronics
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