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Homepage>UNE standards>UNE EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
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in stockReleased: 2002-11-01
UNE EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)

UNE EN 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)

Circuitos integrados. Mediciones de las emisiones electromagnéticas de 150 kHz a 1 GHz. Parte 6: Mediciones de emisiones conducidas. Método de sonda magnética. (Ratificada por AENOR en noviembre de 2002)

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Standard number:UNE EN 61967-6:2002
Pages:30
Released:2002-11-01
Status:Standard
DESCRIPTION

This standard UNE EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.) is classified in these ICS categories:

  • 31.200