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in stockReleased: 2014-11-01
UNE EN 62047-22:2014
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)
Dispositivos semiconductores. Dispositivos micro-electromecánicos. Parte 22: Métodos de ensayo de tensión electromecánica para películas delgadas conductoras sobre sustratos flexibles (Ratificada por AENOR en noviembre de 2014.)
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| Standard number: | UNE EN 62047-22:2014 |
| Pages: | 14 |
| Released: | 2014-11-01 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 62047-22:2014 Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.) is classified in these ICS categories:
- 01.080.99
- 31.080.99