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in stockReleased: 2011-03-01
UNE EN 62374-1:2010
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
Dispositivos semiconductores. Ensayo de ruptura dieléctrica dependiente del tiempo (TDDB) para capas intermetálicas (Ratificada por AENOR en marzo de 2011.)
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| Standard number: | UNE EN 62374-1:2010 |
| Pages: | 19 |
| Released: | 2011-03-01 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 62374-1:2010 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.) is classified in these ICS categories:
- 31.080