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Homepage>UNE standards>UNE EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)
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in stockReleased: 2010-09-01
UNE EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

UNE EN 62415:2010

Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

Dispositivos de semiconductores. Ensayo de electromigración de intensidad constante. (Ratificada por AENOR en septiembre de 2010.)

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Standard number:UNE EN 62415:2010
Pages:14
Released:2010-09-01
Status:Standard
DESCRIPTION

This standard UNE EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.) is classified in these ICS categories:

  • 31.080.01
Categories:
UNE standards
31.080.01 Semiconductor devices in general
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