PRICES include / exclude VAT
Sponsored link
in stockReleased: 2010-09-01
UNE EN 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Dispositivos semiconductores. Ensayos de iones móviles para transistores de semiconductores de óxido metálico de efecto de campo (MOSFET) (Ratificada por AENOR en septiembre de 2010.)
Format
Availability
Price and currency
English PDF
Immediate download
41.80 EUR
English Hardcopy
In stock
41.80 EUR
| Standard number: | UNE EN 62417:2010 |
| Pages: | 11 |
| Released: | 2010-09-01 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.) is classified in these ICS categories:
- 31.080.01