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in stockReleased: 2010-10-01
UNE EN 62418:2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Dispositivos semiconductores. Ensayo de esfuerzos para metalización en vacio (Ratificada por AENOR en octubre de 2010.)
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| Standard number: | UNE EN 62418:2010 |
| Pages: | 20 |
| Released: | 2010-10-01 |
| Status: | Standard |
DESCRIPTION
This standard UNE EN 62418:2010 Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.) is classified in these ICS categories:
- 31.080.01