PRICES include / exclude VAT
Homepage>UNE standards>UNE EN IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)
Sponsored link
in stockReleased: 2022-07-01
UNE EN IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)

UNE EN IEC 60749-10:2022

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 10: Choque mecánico. Dispositivo y submontaje. (Ratificada por la Asociación Española de Normalización en julio de 2022.)

Format
Availability
Price and currency
English PDF
Immediate download
66.00 EUR
English Hardcopy
In stock
66.00 EUR
Standard number:UNE EN IEC 60749-10:2022
Pages:20
Released:2022-07-01
Status:Standard
DESCRIPTION

This standard UNE EN IEC 60749-10:2022 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.) is classified in these ICS categories:

  • 31.080.01