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Homepage>UNE standards>UNE EN IEC 60749-12:2018 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
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in stockReleased: 2018-04-01
UNE EN IEC 60749-12:2018 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)

UNE EN IEC 60749-12:2018

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 12: Vibraciones, frecuencias variables. (Ratificada por la Asociación Española de Normalización en abril de 2018.)

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Standard number:UNE EN IEC 60749-12:2018
Pages:15
Released:2018-04-01
Status:Standard
DESCRIPTION

This standard UNE EN IEC 60749-12:2018 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.) is classified in these ICS categories:

  • 31.080.01