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Homepage>UNE standards>UNE EN IEC 61967-8:2023 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)
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in stockReleased: 2023-07-01
UNE EN IEC 61967-8:2023 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)

UNE EN IEC 61967-8:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)

Circuitos integrados. Mediciones de las emisiones electromagnéticas. Parte 8: Medición de las emisiones radiadas. Método IC de líneas TEM de placas. (Ratificada por la Asociación Española de Normalización en julio de 2023.)

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Standard number:UNE EN IEC 61967-8:2023
Pages:26
Released:2023-07-01
Status:Standard
DESCRIPTION

This standard UNE EN IEC 61967-8:2023 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.) is classified in these ICS categories:

  • 31.200