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UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2003-11-21
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44.88 EUR
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44.88 EUR
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37.40 EUR
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37.40 EUR
UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
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51.48 EUR
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51.48 EUR
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42.90 EUR
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42.90 EUR
UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
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60.72 EUR
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60.72 EUR
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50.60 EUR
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50.60 EUR
UNE EN 60749-32:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2004-03-18
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44.88 EUR
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37.40 EUR
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37.40 EUR
UNE EN 60749-32:2004/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-01-19
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44.88 EUR
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44.88 EUR
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37.40 EUR
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37.40 EUR
UNE EN 60749-34:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
Released: 2011-07-20
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76.56 EUR
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76.56 EUR
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63.80 EUR
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63.80 EUR
UNE EN 60749-36:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
Released: 2004-03-18
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44.88 EUR
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44.88 EUR
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37.40 EUR
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37.40 EUR
UNE EN 60793-1-1:2017
Optical fibres - Part 1-1: Measurement methods and test procedures - General and guidance
Optical fibres - Part 1-1: Measurement methods and test procedures - General and guidance
Released: 2017-07-05
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83.16 EUR
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83.16 EUR
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69.30 EUR
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69.30 EUR
UNE EN 60793-1-33:2018
Optical fibres - Part 1-33: Measurement methods and test procedures - Stress corrosion susceptibility
Optical fibres - Part 1-33: Measurement methods and test procedures - Stress corrosion susceptibility
Released: 2018-03-28
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125.40 EUR
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125.40 EUR
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104.50 EUR
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104.50 EUR
UNE EN 60793-1-43:2015
Optical fibres - Part 1-43: Measurement methods and test procedures - Numerical aperture measurement
Optical fibres - Part 1-43: Measurement methods and test procedures - Numerical aperture measurement
Released: 2015-09-30
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89.76 EUR
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89.76 EUR
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74.80 EUR
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74.80 EUR
UNE EN 60794-1-1:2016
Optical fibre cables - Part 1-1: Generic specification - General
Optical fibre cables - Part 1-1: Generic specification - General
Released: 2016-06-15
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97.68 EUR
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97.68 EUR
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81.40 EUR
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81.40 EUR
UNE EN 60811-100:2012
Electric and optical fibre cables - Test methods for non-metallic materials - Part 100: General
Electric and optical fibre cables - Test methods for non-metallic materials - Part 100: General
Released: 2012-12-28
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76.56 EUR
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76.56 EUR
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63.80 EUR
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63.80 EUR