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UNE EN 62391-1:2016
Fixed electric double-layer capacitors for use in electric and electronic equipment - Part 1: Generic specification (Endorsed by AENOR in April of 2016.)
Fixed electric double-layer capacitors for use in electric and electronic equipment - Part 1: Generic specification (Endorsed by AENOR in April of 2016.)
Released: 2016-04-01
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2.19 EUR
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74.80 EUR
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UNE EN 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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UNE EN 62417:2010
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (Endorsed by AENOR in September of 2010.)
Released: 2010-09-01
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UNE EN 62418:2010
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Semiconductor devices - Metallization stress void test (Endorsed by AENOR in October of 2010.)
Released: 2010-10-01
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UNE EN 62439-7:2012
Industrial communication networks - High availability automation networks - Part 7: Ring-based Redundancy Protocol (RRP) (Endorsed by AENOR in June of 2012.)
Industrial communication networks - High availability automation networks - Part 7: Ring-based Redundancy Protocol (RRP) (Endorsed by AENOR in June of 2012.)
Released: 2012-06-01
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